Publication Year:
Author(s): Riley D. Logan, Erica Venkatesulu, Joseph A. Shaw
Abstract
Optical remote sensing systems are often used to gather imagery of scenes containing partially polarized light. Partially polarized reflection or emission will affect the detected response if the sensor system has intentional or unintentional polarization sensitivity. As the use of optical remote sensing systems becomes more widespread, the factors affecting the response of these systems needs to be better understood. In this paper, we present the results of polarization response measurements of six hyperspectral imaging systems manufactured by Resonon Inc. The imagers included in this study cover wavelengths from approximately 350nm to 1700 nm, with various spectral sampling rates. Efforts are ongoing to model and compensate for the observed response.
Citation
Logan, R. D., Venkatesulu, E., & Shaw, J. A. (2021). Comparing the polarimetric response of hyperspectral imagers. In F. Snik, M. K. Kupinski, & J. A. Shaw (Eds.), Polarization Science and Remote Sensing X (p. 21). Proc. SPIE, 11833. https://doi.org/10.1117/12.2595588